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Investigation of the structural properties of annealed CdIn2Te4/CdS thin film solar cells produced by the electron-beam evaporation (e-beam) technique

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dc.contributor.author Kırbaş, İ.
dc.contributor.author Karabacak, R.
dc.date.accessioned 2019-08-16T12:57:06Z
dc.date.available 2019-08-16T12:57:06Z
dc.date.issued 2017
dc.identifier.issn 00360244 (ISSN)
dc.identifier.uri http://acikerisim.pau.edu.tr:8080/xmlui/handle/11499/8901
dc.description.abstract Thin film CdIn2Te4/CdS solar cells were deposited onto the ITO-coated glass substrate by electron beam evaporation (e-beam) technique, and the the effect of annealing on their structural properties is studied. The annealing was performed under nitrogen atmosphere for 1 h. The manufactured solar cells were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX) analysis. Crystallite size (D), inter-planer distance (d) and lattice constant (a) values were calculated for the thin film solar cell from XRD data. Annealed samples display well defined XRD patterns with three diffraction peaks. We observed increased peak intensity in the annealed films. EDAX analysis showed that only CdIn2Te4 is present in absorber layer and CdS is found in the window layer, but no impurity atoms are present the structure. It is observed that surface roughness of the annealed films incresed, according to SEM images. The I–V characteristics show that the current is increased for annealed thin films solar cells. © 2017, Pleiades Publishing, Ltd.
dc.language.iso English
dc.publisher Maik Nauka-Interperiodica Publishing
dc.relation.isversionof 10.1134/S0036024417100168
dc.subject electron beam evaporation
dc.subject semiconductors
dc.subject structural properties
dc.subject thin films
dc.subject X-ray diffraction (XRD)
dc.subject Annealing
dc.subject Cadmium sulfide
dc.subject Crystallite size
dc.subject Electron beams
dc.subject Electrons
dc.subject Evaporation
dc.subject ITO glass
dc.subject Physical vapor deposition
dc.subject Scanning electron microscopy
dc.subject Semiconductor materials
dc.subject Solar cells
dc.subject Structural properties
dc.subject Substrates
dc.subject Surface roughness
dc.subject Thin films
dc.subject X ray diffraction
dc.subject Annealed samples
dc.subject Coated glass substrates
dc.subject Diffraction peaks
dc.subject Effect of annealing
dc.subject Electron beam evaporation
dc.subject Energy dispersive x-ray
dc.subject Nitrogen atmospheres
dc.subject Thin films solar cells
dc.subject Thin film solar cells
dc.title Investigation of the structural properties of annealed CdIn2Te4/CdS thin film solar cells produced by the electron-beam evaporation (e-beam) technique
dc.type Article
dc.relation.journal Russian Journal of Physical Chemistry A
dc.identifier.volume 91
dc.identifier.issue 10
dc.identifier.startpage 2039
dc.identifier.endpage 2043
dc.identifier.index Scopus

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